TY  - RPRT
TI  - Thermoelastic study of nanolayered structures using time-resolved x-ray diffraction at high repetition rate
AU  - H. A. Navirian
AU  - D. Schick
AU  - P. Gaal
AU  - W. Leitenberger
AU  - R. Shayduk
AU  - M. Bargheer
PY  - 2013
DO  - 10.1063/1.4861873
UR  - https://arxiv.org/abs/1306.4165
ID  - 1306.4165
ER  -