@misc{indiciaeef6f31252ddd,
  title = {Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology},
  author = {Y. W. Zhang and H. X. Huang and D. W. Bi and C. Peng and M. H. Tang and Z. X. Zhang},
  year = {2013},
  doi = {10.1016/j.nima.2014.01.052},
  url = {https://arxiv.org/abs/1307.0327},
  note = {Source identifier: 1307.0327}
}