TY  - RPRT
TI  - Investigation of Unique Total Ionizing Dose Effects in 0.2 um Partially-Depleted Silicon-on-Insulator Technology
AU  - Y. W. Zhang
AU  - H. X. Huang
AU  - D. W. Bi
AU  - C. Peng
AU  - M. H. Tang
AU  - Z. X. Zhang
PY  - 2013
DO  - 10.1016/j.nima.2014.01.052
UR  - https://arxiv.org/abs/1307.0327
ID  - 1307.0327
ER  -