TY  - RPRT
TI  - Temperature-Dependent Defect Dynamics in the Network Glass SiO2
AU  - Katharina Vollmayr-Lee
AU  - Annette Zippelius
PY  - 2013
DO  - 10.1103/physreve.88.052145
UR  - https://arxiv.org/abs/1307.2079
ID  - 1307.2079
ER  -