@misc{indiciae491bf84e2b82,
  title = {Automated Defect Localization via Low Rank Plus Outlier Modeling of Propagating Wavefield Data},
  author = {Stefano Gonella and Jarvis D. Haupt},
  year = {2013},
  doi = {10.1109/tuffc.2013.2854},
  url = {https://arxiv.org/abs/1307.5102},
  note = {Source identifier: 1307.5102}
}