TY  - RPRT
TI  - Characterization of highly anisotropic three-dimensionally nanostructured surfaces
AU  - Daniel Schmidt
PY  - 2013
DO  - 10.1016/j.tsf.2013.10.119
UR  - https://arxiv.org/abs/1308.2942
ID  - 1308.2942
ER  -