TY  - RPRT
TI  - Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates
AU  - Song-Lin Li
AU  - Hisao Miyazaki
AU  - Haisheng Song
AU  - Hiromi Kuramochi
AU  - Shu Nakaharai
AU  - Kazuhito Tsukagoshi
PY  - 2013
DO  - 10.1021/nn3025173
UR  - https://arxiv.org/abs/1308.3835
ID  - 1308.3835
ER  -