TY  - RPRT
TI  - Thickness-Dependent Interfacial Coulomb Scattering in Atomically Thin Field-Effect Transistors
AU  - Song-Lin Li
AU  - Katsunori Wakabayashi
AU  - Yong Xu
AU  - Shu Nakaharai
AU  - Katsuyoshi Komatsu
AU  - Wen-Wu Li
AU  - Yen-Fu Lin
AU  - Alex Aparecido-Ferreira
AU  - Kazuhito Tsukagoshi
PY  - 2013
DO  - 10.1021/nl4010783
UR  - https://arxiv.org/abs/1308.3837
ID  - 1308.3837
ER  -