TY  - RPRT
TI  - Stress Evolution in Composite Silicon Electrodes during Lithiation/Delithiation
AU  - Vijay A. Sethuraman
AU  - Annam Nguyen
AU  - Michael J. Chon
AU  - Siva P. V. Nadimpalli
AU  - Hailong Wang
AU  - Daniel P. Abraham
AU  - Allan F. Bower
AU  - Vivek B. Shenoy
AU  - Pradeep R. Guduru
PY  - 2013
DO  - 10.1149/2.021306jes
UR  - https://arxiv.org/abs/1308.3873
ID  - 1308.3873
ER  -