@misc{indiciae65a6a4e54ca8,
  title = {Origin of defects responsible for charge transport in resistive random access memory based on hafnia},
  author = {Damir R. Islamov and T. V. Perevalov and V. A. Gritsenkov and V. Sh. Aliev and A. A. Saraev and V. V. Kaichev and E. V. Ivanova and M. V. Zamoryanskaya and C. H. Cheng and Albert Chin},
  year = {2013},
  url = {https://arxiv.org/abs/1309.0071},
  note = {Source identifier: 1309.0071}
}