TY  - RPRT
TI  - Origin of defects responsible for charge transport in resistive random access memory based on hafnia
AU  - Damir R. Islamov
AU  - T. V. Perevalov
AU  - V. A. Gritsenkov
AU  - V. Sh. Aliev
AU  - A. A. Saraev
AU  - V. V. Kaichev
AU  - E. V. Ivanova
AU  - M. V. Zamoryanskaya
AU  - C. H. Cheng
AU  - Albert Chin
PY  - 2013
UR  - https://arxiv.org/abs/1309.0071
ID  - 1309.0071
ER  -