TY  - RPRT
TI  - Effect of Temperature and Charged Particle Fluence on the Resistivity of Polycrystalline CVD Diamond Sensors
AU  - Rui Wang
AU  - Martin Hoeferkamp
AU  - Sally Seidel
PY  - 2013
DO  - 10.1016/j.nima.2013.10.007
UR  - https://arxiv.org/abs/1310.2620
ID  - 1310.2620
ER  -