TY  - RPRT
TI  - Damage in graphene due to electronic excitation induced by highly charged ions
AU  - J. Hopster
AU  - R. Kozubek
AU  - B. Ban-d'Etat
AU  - S. Guillous
AU  - H. Lebius
AU  - M. Schleberger
PY  - 2013
UR  - https://arxiv.org/abs/1310.6233
ID  - 1310.6233
ER  -