TY  - RPRT
TI  - Towards wafer scale inductive determination of magnetostatic and dynamic parameters of magnetic thin films and multilayers
AU  - Sibylle Sievers
AU  - Niklas Liebing
AU  - Paul Nass
AU  - Santiago Serrano-Guisan
AU  - Massimo Pasquale
AU  - Hans Werner Schumacher
PY  - 2013
DO  - 10.1109/tmag.2012.2219512
UR  - https://arxiv.org/abs/1310.6578
ID  - 1310.6578
ER  -