@misc{indiciae4e029edf557e,
  title = {Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features},
  author = {Sahil Sikka and Karan Sikka and M. K. Bhuyan and Yuji Iwahori},
  year = {2013},
  url = {https://arxiv.org/abs/1310.6654},
  note = {Source identifier: 1310.6654}
}