TY  - RPRT
TI  - Pseudo vs. True Defect Classification in Printed Circuits Boards using Wavelet Features
AU  - Sahil Sikka
AU  - Karan Sikka
AU  - M. K. Bhuyan
AU  - Yuji Iwahori
PY  - 2013
UR  - https://arxiv.org/abs/1310.6654
ID  - 1310.6654
ER  -