TY  - RPRT
TI  - Rapid and reliable thickness identification of two-dimensional nanosheets using optical microscopy
AU  - Hai Li
AU  - Jumiati Wu
AU  - Xiao Huang
AU  - Gang Lu
AU  - Jian Yang
AU  - Xin Lu
AU  - Qihua Xiong
AU  - Hua Zhang
PY  - 2013
DO  - 10.1021/nn4047474
UR  - https://arxiv.org/abs/1310.6863
ID  - 1310.6863
ER  -