@misc{indiciaed3da4d87d39a,
  title = {Selective reflection technique as a probe to monitor the growth of a metallic thin film on dielectric surfaces},
  author = {Weliton Soares Martins and Marcos Oriá and Martine Chevrollier and Thierry Passerat de Silans},
  year = {2013},
  doi = {10.1364/ao.52.006074},
  url = {https://arxiv.org/abs/1310.8624},
  note = {Source identifier: 1310.8624}
}