TY  - RPRT
TI  - Selective reflection technique as a probe to monitor the growth of a metallic thin film on dielectric surfaces
AU  - Weliton Soares Martins
AU  - Marcos Oriá
AU  - Martine Chevrollier
AU  - Thierry Passerat de Silans
PY  - 2013
DO  - 10.1364/ao.52.006074
UR  - https://arxiv.org/abs/1310.8624
ID  - 1310.8624
ER  -