TY  - RPRT
TI  - Low-frequency Noise in Individual Carbon Nanotube Field-Effect Transistors with Top, Side and Back Gate Configurations: Effect of Gamma Irradiation
AU  - V. A. Sydoruk
AU  - K. Goß
AU  - C. Meyer
AU  - M. V. Petrychuk
AU  - B. A. Danilchenko
AU  - P. Weber
AU  - C. Stampfer
AU  - J. Li
AU  - S. A. Vitusevich
PY  - 2013
DO  - 10.1088/0957-4484/25/3/035703
UR  - https://arxiv.org/abs/1311.4312
ID  - 1311.4312
ER  -