TY  - RPRT
TI  - Hard x-ray emission spectroscopy: a powerful tool for the characterization of magnetic semiconductors
AU  - Mauro Rovezzi
AU  - Pieter Glatzel
PY  - 2014
DO  - 10.1088/0268-1242/29/2/023002
UR  - https://arxiv.org/abs/1312.0399
ID  - 1312.0399
ER  -