TY  - RPRT
TI  - Electronic Hong-Ou-Mandel interferometry in two-dimensional topological insulators
AU  - D. Ferraro
AU  - C. Wahl
AU  - J. Rech
AU  - T. Jonckheere
AU  - T. Martin
PY  - 2014
DO  - 10.1103/physrevb.89.075407
UR  - https://arxiv.org/abs/1312.1924
ID  - 1312.1924
ER  -