TY  - RPRT
TI  - Measure of Diracness in two-dimensional semiconductors
AU  - M. O. Goerbig
AU  - G. Montambaux
AU  - F. Piéchon
PY  - 2014
DO  - 10.1209/0295-5075/105/57005
UR  - https://arxiv.org/abs/1312.3879
ID  - 1312.3879
ER  -