@misc{indiciae0e3b12469fbb,
  title = {Thickness Estimation of the Si Thin Films: a Simulation Study},
  author = {Mohammad Babazadeh and Abdollah Rahmat Nezamabad and Hossein Movla and Farzad Ghafari Jouneghani},
  year = {2014},
  doi = {10.1016/j.ijleo.2015.02.059},
  url = {https://arxiv.org/abs/1401.4139},
  note = {Source identifier: 1401.4139}
}