TY  - RPRT
TI  - Thickness Estimation of the Si Thin Films: a Simulation Study
AU  - Mohammad Babazadeh
AU  - Abdollah Rahmat Nezamabad
AU  - Hossein Movla
AU  - Farzad Ghafari Jouneghani
PY  - 2014
DO  - 10.1016/j.ijleo.2015.02.059
UR  - https://arxiv.org/abs/1401.4139
ID  - 1401.4139
ER  -