TY  - RPRT
TI  - Effect of line defects on the electrical transport properties of monolayer MoS$_{2}$ sheet
AU  - Amretashis Sengupta
AU  - Dipankar Saha
AU  - Thomas A. Niehaus
AU  - Santanu Mahapatra
PY  - 2014
DO  - 10.1109/tnano.2014.2364038
UR  - https://arxiv.org/abs/1401.4553
ID  - 1401.4553
ER  -