TY  - RPRT
TI  - Optical Absorption Measurement at 1550 nm on a Highly-Reflective Si/SiO$_2$ Coating Stack
AU  - Jessica Steinlechner
AU  - Alexander Khalaidovski
AU  - Roman Schnabel
PY  - 2014
DO  - 10.1088/0264-9381/31/10/105005
UR  - https://arxiv.org/abs/1401.4916
ID  - 1401.4916
ER  -