TY  - RPRT
TI  - Methodology for standard cell compliance and detailed placement for triple patterning lithography
AU  - Bei Yu
AU  - Xiaoqing Xu
AU  - Jhih-Rong Gao
AU  - David Z. Pan
PY  - 2014
UR  - https://arxiv.org/abs/1402.2635
ID  - 1402.2635
ER  -