@misc{indiciaeade67cec216b,
  title = {EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation},
  author = {Duo Ding and Bei Yu and Joydeep Ghosh and David Z. Pan},
  year = {2014},
  doi = {10.1109/aspdac.2012.6164956},
  url = {https://arxiv.org/abs/1402.2904},
  note = {Source identifier: 1402.2904}
}