TY  - RPRT
TI  - EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation
AU  - Duo Ding
AU  - Bei Yu
AU  - Joydeep Ghosh
AU  - David Z. Pan
PY  - 2014
DO  - 10.1109/aspdac.2012.6164956
UR  - https://arxiv.org/abs/1402.2904
ID  - 1402.2904
ER  -