TY  - RPRT
TI  - Simultaneous Extraction of Charge Density Dependent Mobility and Variable Contact Resistance from Thin Film Transistors
AU  - Riccardo Di Pietro
AU  - Deepak Venkateshvaran
AU  - Andreas Klug
AU  - Emil J. W. List-Kratochvil
AU  - Antonio Facchetti
AU  - Henning Sirringhaus
AU  - Dieter Neher
PY  - 2014
DO  - 10.1063/1.4876057
UR  - https://arxiv.org/abs/1402.5241
ID  - 1402.5241
ER  -