TY  - RPRT
TI  - Microscopic Origin of Charged Impurity Scattering and Flicker Noise in MoS2 field-effect Transistors
AU  - Subhamoy Ghatak
AU  - Sumanta Mukherjee
AU  - Manish Jain
AU  - D. D. Sarma
AU  - Arindam Ghosh
PY  - 2014
UR  - https://arxiv.org/abs/1403.3333
ID  - 1403.3333
ER  -