TY  - RPRT
TI  - The influence of a single defect in composite gate insulators on the performance of nanotube transistors
AU  - Wen-Juan Yu
AU  - Neng-Ping Wang
PY  - 2014
DO  - 10.1140/epjb/e2014-50443-3
UR  - https://arxiv.org/abs/1403.3505
ID  - 1403.3505
ER  -