TY  - RPRT
TI  - Optimal design for step-stress accelerated test with random discrete stress elevating times based on gamma degradation process
AU  - Morteza Amini
AU  - Soudabeh Shemehsavar
AU  - Zhengqiang Pan
PY  - 2014
UR  - https://arxiv.org/abs/1404.3806
ID  - 1404.3806
ER  -