TY  - RPRT
TI  - Importance of frequency-dependent grain boundary scattering in nanocrystalline silicon and silicon-germanium thermoelectrics
AU  - Chengyun Hua
AU  - Austin J. Minnich
PY  - 2014
DO  - 10.1088/0268-1242/29/12/124004
UR  - https://arxiv.org/abs/1404.7847
ID  - 1404.7847
ER  -