TY  - RPRT
TI  - Effect of realistic metal electronic structure on the lower limit of contact resistivity of epitaxial metal-semiconductor contacts
AU  - Ganesh Hegde
AU  - R. Chris Bowen
PY  - 2014
DO  - 10.1063/1.4892559
UR  - https://arxiv.org/abs/1405.1317
ID  - 1405.1317
ER  -