@misc{indiciae26cae459500b,
  title = {Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy},
  author = {J. Schaab and I. P. Krug and F. Nickel and D. M. Gottlob and H. Doğanay and A. Cano and M. Hentschel and Z. Yan and E. Bourret and C. M. Schneider and R. Ramesh and D. Meier},
  year = {2014},
  doi = {10.1063/1.4879260},
  url = {https://arxiv.org/abs/1405.2053},
  note = {Source identifier: 1405.2053}
}