TY  - RPRT
TI  - Thickness and growth-condition dependence of \emph{in-situ} mobility and carrier density of epitaxial thin-film Bi$_2$Se$_3$
AU  - Jack Hellerstedt
AU  - Mark Edmonds
AU  - J. H. Chen
AU  - William G. Cullen
AU  - C. X. Zheng
AU  - Michael S. Fuhrer
PY  - 2014
DO  - 10.1063/1.4900749
UR  - https://arxiv.org/abs/1405.5692
ID  - 1405.5692
ER  -