TY  - RPRT
TI  - A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements
AU  - Thomas Schneider
AU  - Dominique Leduc
AU  - Cyril Lupi
AU  - Julien Cardin
AU  - Hartmut Gundel
AU  - Christian Boisrobert
PY  - 2014
DO  - 10.1063/1.2885147
UR  - https://arxiv.org/abs/1405.6501
ID  - 1405.6501
ER  -