TY  - RPRT
TI  - Impact of gate leakage considerations in tunnel field effect transistor design
AU  - Poornendu Chaturvedi
AU  - M. Jagadesh Kumar
PY  - 2014
DO  - 10.7567/jjap.53.074201
UR  - https://arxiv.org/abs/1406.1319
ID  - 1406.1319
ER  -