TY  - RPRT
TI  - Signatures of localization in the effective metallic regime of high mobility Si MOSFETs
AU  - S. Das Sarma
AU  - E. H. Hwang
AU  - K. Kechedzhi
AU  - L. A. Tracy
PY  - 2014
DO  - 10.1103/physrevb.90.125410
UR  - https://arxiv.org/abs/1406.3024
ID  - 1406.3024
ER  -