TY  - RPRT
TI  - Self-consistent Capacitance-Voltage Characterization of Gate-all-around Graded Nanowire Transistor
AU  - Saeed Uz Zaman Khan
AU  - Md. Shafayat Hossain
AU  - Md. Obaidul Hossen
AU  - Fahim Ur Rahman
AU  - Rifat Zaman
AU  - Quazi D. M. Khosru
PY  - 2014
UR  - https://arxiv.org/abs/1406.5257
ID  - 1406.5257
ER  -