TY  - RPRT
TI  - Resistance of helical edges formed in a semiconductor heterostructure
AU  - Jukka I. Väyrynen
AU  - Moshe Goldstein
AU  - Yuval Gefen
AU  - Leonid I. Glazman
PY  - 2015
DO  - 10.1103/physrevb.90.115309
UR  - https://arxiv.org/abs/1406.6052
ID  - 1406.6052
ER  -