TY  - RPRT
TI  - Effects of the Cu off-stoichiometry on transport properties of wide gap p-type semiconductor, layered oxysulfide LaCuSO
AU  - Yosuke Goto
AU  - Mai Tanaki
AU  - Yuki Okusa
AU  - Taizo Shibuya
AU  - Kenji Yasuoka
AU  - Masanori Matoba
AU  - Yoichi Kamihara
PY  - 2014
DO  - 10.1063/1.4890302
UR  - https://arxiv.org/abs/1407.2342
ID  - 1407.2342
ER  -