TY  - RPRT
TI  - Effect of strain on electronic and thermoelectric properties of few layers to bulk MoS$_{2}$
AU  - Swastibrata Bhattacharyya
AU  - Tribhuwan Pandey
AU  - Abhishek K. Singh
PY  - 2014
DO  - 10.1088/0957-4484/25/46/465701
UR  - https://arxiv.org/abs/1407.7522
ID  - 1407.7522
ER  -