TY  - RPRT
TI  - Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context
AU  - Francois Vernotte
AU  - Eric Lantz
PY  - 2015
DO  - 10.1088/0026-1394/52/2/222
UR  - https://arxiv.org/abs/1407.7760
ID  - 1407.7760
ER  -