TY  - RPRT
TI  - Graphene defect formation by extreme ultraviolet generated photoelectrons
AU  - A. Gao
AU  - C. J. Lee
AU  - F. Bijkerk
PY  - 2014
DO  - 10.1063/1.4892485
UR  - https://arxiv.org/abs/1408.5704
ID  - 1408.5704
ER  -