@misc{indiciae0db6d7ee30dc,
  title = {Measurements of the exchange stiffness of YIG films by microwave resonance techniques},
  author = {Stefan Klingler and Andrii V. Chumak and Tim Mewes and Behrouz Khodadadi and Claudia Mewes and Carsten Dubs and Oleksii Surzhenko and Burkard Hillebrands and Andrés Conca},
  year = {2014},
  doi = {10.1088/0022-3727/48/1/015001},
  url = {https://arxiv.org/abs/1408.5772},
  note = {Source identifier: 1408.5772}
}