@misc{indiciae0a18bbea155f,
  title = {Stochastic Testing Simulator for Integrated Circuits and MEMS: Hierarchical and Sparse Techniques},
  author = {Zheng Zhang and Xiu Yang and Giovanni Marucci and Paolo Maffezzoni and Ibrahim and M. Elfadel and George Em Karniadakis and Luca Daniel},
  year = {2014},
  doi = {10.1109/cicc.2014.6946009},
  url = {https://arxiv.org/abs/1409.4822},
  note = {Source identifier: 1409.4822}
}