@misc{indiciae9f7df678bf64,
  title = {Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos},
  author = {Zheng Zhang and Tarek A. El-Moselhy and Ibrahim and M. Elfadel and Luca Daniel},
  year = {2014},
  doi = {10.1109/tcad.2013.2263039},
  url = {https://arxiv.org/abs/1409.4831},
  note = {Source identifier: 1409.4831}
}